Bryan D. Huey

Associate Professor Bryan HueyBryan D. Huey
Department Head, Professor,
Ph.D., University of Pennsylvania

Department of Materials Science & Engineering
97 North Eagleville Road, Unit 3136
Storrs, CT 06269-3136
Office: IMS-111
Phone: 860.486.3284
Fax: 860.486.4745
Email: bryan.huey@uconn.edu Web: http://hueyafmlabs.mse.uconn.edu/


 Current Research

  • Switching dynamics in ferroelectric and multiferroic materials.
  • Piezoactuation of novel Piezoelectrics.
  • In-situ imaging of Micro-Electro-Mechanical-Systems.
  • Nanoscale performance mapping of photovoltaics.
  • Photovoltaic reliability and accelerated lifetime testing.
  • Nanomechanical dynamics of tissue and living cells.
  • Characterization of various nanomaterials and structures.
  • Ultrasonic micro-manipulation.
  • Various industrial partnerships.
  • High Speed AFM and combined AFM/optics.

Awards & Honors

2016 Fulrath Award (American Ceramics Society)
2014/15 Chair: Basic Science Division, American Ceramic Society
2013 Conference Co-Organizer: Electronic Materials and Applications
2011-2012 VELUX Visiting Professor, Villum Foundation, iNANO Institute, Aarhus University, Denmark
2007 Outstanding faculty member (teaching, research, service), UConn MS&E
2003-2004 NRC Fellowship
2001 NSF International Postdoctoral Award
2000 Marshall-Sherfield Fellowship
1999 S. J. Stein Prize, outstanding Engineering Thesis, University of Pennsylvania
Fall 1998 Materials Research Society, graduate student Gold Medal
1996 William S. Yerger Memorial Prize, outstanding graduate student, University of Pennsylvania

Significant Publications

Y. Kutes, J. Luria, Y Sun, A. Moore, B. A. Aguirre, M. Aindow, D. Zubia, B.D. Huey, Nanoscale Planarization and Cross Sectional Milling via Atomic Force Microscopy for Microscopic Characterization of Solar Cells, Nanotechnology, 28 (18), p. 185705, 2017.

R. Keech, L. Ye, J. L. Bosse, G. Esteves, J. Guerrier, J. L. Jones, M. A. Kuroda, B. D. Huey, S. Trolier-McKinstry, Declamped Piezoelectric Coefficients in Patterned 70/30 Lead Magnesium Niobate–Lead Titanate Thin Films, Advanced Functional Materials, 27 (9), 1605014, 2017.

J. Luria, Y. Kutes, A. Moore, L. Zhang, E. Stach, B. D. Huey, Charge Transport in CdTe Solar Cells Revealed by Conductive Tomographic Atomic Force Microscopy, Nature Energy, p. 16150 (1-6), 2016.

Y. Kutes, Y. Zhou, J. Bosse, J. Steffes, N. P. Padture, B. D. Huey, Mapping the Photoresponse of CH3NH3PbI3 Hybrid Perovskite Thin Films at the Nanoscale, Nanoletters, 16 (6), 3434-41, 2016.

Y. Kutes, B.A. Aguirre, J.L. Bosse, J.L. Cruz-Campa, D. Zubia, B.D. Huey, Mapping Photovoltaic Performance with Nanoscale Resolution, Progress in Photovoltaics, 24 (3), p. 315-25, 2016.

M. Rivas, V. Vyas, A. Carter, J. Veronick, Y. Khan, O. V. Kolosov, R. Polcawich, B. D. Huey, “Nanoscale mapping of in situ actuating microelectromechanical systems with AFM,” J. Materials Research (& cover), 30 (3), 1-13, 2015.

J. T. Heron, J. Bosse, Q. He, Y. Gao, M. Trassin, L. Ye, J. D. Clarkson, C. Wang, J. Liu, S. Salahuddin, D. C. Ralph, D. G. Schlom, J. Iniguez, B. D. Huey, R. Ramesh, “Deterministic Switching of Ferromagnetism at Room Temperature Using an Electric Field,” Nature, 516, 370-73, 2014.

Y. Kutes, L. Ye, Y. Zhou, S. Pang, B. D. Huey, N. P. Padture, “Direct Observation of Ferroelectric Domains in Solution-Processed CH3NH3PbI3 Perovskite Thin Films,” JPCL, 5 (19), 3335–3339, 2014.

Bosse, J.L. and B.D. Huey, “Error-corrected AFM: a simple and broadly applicable approach for substantially improving AFM image accuracy,” Nanotechnology, 25 (15), 2014.

J. L. Bosse, S. Lee, A. S. Andersen, D. S. Sutherland, B. D. Huey, “High Speed Friction Microscopy and Nanoscale Friction Coefficient Mapping,” Meas. Sci. and Tech., 25 (11), 2013.

I. Grishin, B.D. Huey, and O.V. Kolosov, “Three-Dimensional Nanomechanical Mapping of Amorphous and Crystalline Phase Transitions in Phase-Change Materials,” ACS Applied Materials & Interfaces, 5 (21), 11441-11445, 2013.

B. D. Huey, R. Nath, S. Lee, N. A. Polomoff, “High Speed SPM Applied for Direct Nanoscale Mapping of the Influence of Defects on Ferroelectric Switching Dynamics,” J. ACerS (& cover), 95 [4] 1147-1162, 2012.

S. Verma, B. D. Huey, D. J. Burgess, “Scanning probe microscopy method for nanosuspension stabilizer selection,” Langmuir, 25 (21), pp. 12481-7, 2009.

B. D. Huey, “AFM and Acoustics: Fast, Quantitative, Nanomechanical Mapping,” Annual Reviews of Materials Research, 37, 2007, p. 351-85.